|
PolyU Institutional Repository >
Applied Physics >
AP Patents >
Please use this identifier to cite or link to this item:
http://hdl.handle.net/10397/88
|
| Title: | Measurement of lateral yarn density distribution |
| Authors: | Choi, Ka-fai
Wong, Yuen-wah |
| Subjects: | Lateral yarn density distribution
Measuring apparatus |
| Issue Date: | 10-Jun-2003 |
| Citation: | US Patent 6,577,706 B2. Washington, DC: US Patent and Trademark Office, 2003. |
| Abstract: | An apparatus for measuring the lateral yarn density distribution of a yarn uses selected X-ray radiation. Radiation absorption is determined in a number of narrow planes across the yarn and in two or more rotational orientations. The measuring takes place without any damage to or physical interference with the yarn. |
| Rights: | Assignee: The Hong Kong Polytechnic University. |
| Type: | Patent |
| URI: | http://hdl.handle.net/10397/88 |
| Appears in Collections: | AP Patents
Patents of PolyU
ITC Patents
|
 Facebook
 del.icio.us
 LinkedIn
All items in the PolyU Institutional Repository are protected by copyright, with all rights reserved, unless otherwise indicated.
No item in the PolyU IR may be reproduced for commercial or resale purposes.
|
|
