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|Title: ||Measurement of lateral yarn density distribution|
|Authors: ||Choi, Ka-fai|
|Subjects: ||Lateral yarn density distribution|
|Issue Date: ||10-Jun-2003 |
|Citation: ||US Patent 6,577,706 B2. Washington, DC: US Patent and Trademark Office, 2003.|
|Abstract: ||An apparatus for measuring the lateral yarn density distribution of a yarn uses selected X-ray radiation. Radiation absorption is determined in a number of narrow planes across the yarn and in two or more rotational orientations. The measuring takes place without any damage to or physical interference with the yarn.|
|Rights: ||Assignee: The Hong Kong Polytechnic University.|
|Appears in Collections:||AP Patents|
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