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Please use this identifier to cite or link to this item:
http://hdl.handle.net/10397/668
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| Title: | Exact analytical bit error rates for multiple access chaos-based communication systems |
| Authors: | Tam, Wai M.
Lau, Francis Chung-ming
Tse, C. K. Michael
Lawrance, Anthony J. |
| Subjects: | Chaos-based communications
Exact bit error rate (BER)
Multiple access |
| Issue Date: | Sep-2004 |
| Publisher: | IEEE |
| Citation: | IEEE transactions on circuits and systems. II, Express briefs, Sept. 2004, v. 51, no. 9, p. 473-481. |
| Abstract: | In this paper, exact analytical expressions for the bit error rates (BERs) in a multiple-access chaos-based digital communication system are derived. Comparisons are made with those obtained using traditional approximation methods which assume a Gaussian distribution for the conditional decision parameter. The
obtained results are compared to the results of brute-force (BF) numerical
simulations. It is found that the exact analytical BERs are in perfect agreement with BF simulations and hence provide better prediction of the BER performance than those given by traditional Gaussian-approximation-based methods. |
| Rights: | © 2004 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holders. |
| Type: | Journal/Magazine Article |
| URI: | http://hdl.handle.net/10397/668 |
| ISSN: | 10577130 |
| Appears in Collections: | EIE Journal/Magazine Articles
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