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|Title: ||Coexisting fast-scale and slow-scale instability in current-mode controlled DC/DC converters : analysis, simulation and experimental results|
|Authors: ||Chen, Yanfeng|
Tse, C. K. Michael
|Issue Date: ||Nov-2008 |
|Citation: ||IEEE transactions on circuits and systems. I, Regular papers, Nov. 2008, v. 55, no. 10, p. 3335-3348.|
|Abstract: ||This paper investigates the coexisting fast-scale and slow-scale bifurcations in simple dc/dc converters under peak current-mode control operating in continuous conduction mode. Our focus is the boost converter as it is a representative form of dc/dc converter requiring current-mode control. Effects of varying the input voltage and some chosen parameters on the qualitative behavior of the system are studied in detail. Analysis based on a nonlinear simplified discrete-time model, which takes
into account the effects of parasitics, is performed to investigate the coexistence of fast-scale and slow-scale bifurcations, and to identify the different types of bifurcation. Boundaries of stable region, slow-scale bifurcation region, fast-scale bifurcation region, coexisting fast and slow-scale bifurcation region are identified. Experimental measurements of the boost converter are provided for verification of the analytical results.|
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|Type: ||Journal/Magazine Article|
|Appears in Collections:||EIE Journal/Magazine Articles|
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