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Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/574

Title: Electron irradiation effects in electrostrictive P(VDF-TrFE) copolymers
Authors: Tang, Y. W.
Zhao, X.-Z.
Chan, Helen L. W.
Choy, Chung-loong
Subjects: Dielectric properties
Differential scanning calorimetry
Electric field effects
Electric variables measurement
Electron irradiation
Electrostriction
Fluorine containing polymers
Infrared spectroscopy
Interferometry
Phase transitions
Piezoelectricity
X-ray diffraction analysis
Issue Date: 2001
Publisher: IEEE
Citation: ISAF 2000 : proceedings of the 2000 12th IEEE International Symposium on Applications of Ferroelectrics, Honolulu, Hawaii, U.S.A., July 21-August 2, 2000, p. 793-796.
Abstract: Electrical field-induced strain response of electron-irradiated Poly(vinylidene fluoride-trifluoroethylene) copolymer has been studied by a Mach-Zehnder type Heterodyne interferometer in the frequency range of 3 to 9 kHz. The electrostrictive constant is calculated from the strain results, which is of the same order of magnitude as those obtained at 1 Hz by a bimorph-based strain sensor, but at much lower electrical field. Changes in the piezoelectric coefficient, dielectric property and phase transition behavior of the same copolymer have been studied. The structural changes in the irradiated films were probed by means of differential scanning calorimetry, X-ray diffraction and IR spectra. The reversible solid-state transition between the polar and non-polar phase in the crystalline regions of the copolymer driven by the external electric field is suggested to be responsible for the significant high electrostrictive strain of the electron-irradiated copolymer.
Rights: © 2001 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
Type: Conference Paper
URI: http://hdl.handle.net/10397/574
ISBN: 0780359402
Appears in Collections:AP Conference Papers & Presentations

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