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|Title:||Converse piezoelectric control of the lattice strain and resistance in Pr[sub 0.5]Ca[sub 0.5]MnO₃/PMN-PT structures|
|Authors:||Zheng, R. K.|
Chan, Helen L. W.
Piezoelectric thin films
|Publisher:||American Physical Society|
|Source:||Physical review B, condensed matter and materials physics, 17 Jan. 2007, v. 75, 024110, p. 1-6.|
|Abstract:||Thin films of the charge-ordered Pr[sub 0.5]Ca[sub 0.5]MnO₃ (PCMO) compound have been deposited on (001)-oriented ferroelectric (1−x)Pb(Mg[sub ⅓]Nb[sub ⅔])O₃−xPbTiO₃ (x~0.3)(PMN-PT) single-crystal substrates. The resistance of the PCMO films in the charge-ordered state and paramagnetic state can be modulated by applying dc or ac electric fields across the PMN-PT substrates. Piezoelectric displacement and x-ray diffraction measurements indicate that the electric field induces lattice strains in the PMN-PT substrates via the converse piezoelectric effect, which subsequently changes the strain state and resistance of the PCMO films. Quantitative relationships between the resistance of the PCMO films and the electric-field induced lattice strains in the PMN-PT substrates have been established, which would be important for designing converse piezoelectric effect based functional devices.|
|Rights:||Physical Review B © 2007 American Physical Society. The Journal's web site is located at http://prb.aps.org/|
|Appears in Collections:||MRC Journal/Magazine Articles|
AP Journal/Magazine Articles
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