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|Title: ||Leakage current and relaxation characteristics of highly (111)-oriented lead calcium titanate thin films|
|Authors: ||Tang, Xingui|
Zhang, Y. W.
Chan, Helen L. W.
|Subjects: ||Lead compounds|
Ferroelectric thin films
|Issue Date: ||15-Oct-2003 |
|Publisher: ||American Institute of Physics|
|Citation: ||Journal of applied physics, 15 Oct. 2003, v. 94, no. 8, p.5163-5166.|
|Abstract: ||Highly (111)-oriented (Pb[sub 0.76]Ca[sub 0.24])TiO₃ (PCT) thin films were grown on Pt/Ti/SiO₂/Si substrates by a sol-gel process. The Au/PCT/Pt metal-insulator-metal film capacitor showed well-saturated
hysteresis loops at an applied field of 800 kV/cm with remanent polarization (P[sub r]) and coercive electric field (E[sub c]) values of 18.2 µC/cm² and 210 kV/cm, respectively. The leakage current depended on the voltage polarity. At low electrical field and with Pt electrode biased negatively, the Pt/PCT interface exhibits a Schottky emission characteristics. The Au/PCT interface forms an ohmic contact. The conduction current when the Au electrode is biased negatively shows a
space-charge-limited behavior. The dielectric relaxation current behavior of Au/PCT/Pt capacitor obeys the well-known Curie-von Schweidler law at low electric field. At higher fields, the currents have contributions to both dielectric relaxation current and leakage current.|
|Rights: ||© 2003 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in X.G. Tang et al., J. Appl. Phys. 94, 5163 (2003) and may be found at http://link.aip.org/link/?jap/94/5163|
|Type: ||Journal/Magazine Article|
|Appears in Collections:||MRC Journal/Magazine Articles|
AP Journal/Magazine Articles
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