PolyU IR
 

PolyU Institutional Repository >
Applied Physics >
AP Journal/Magazine Articles >

Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/4872

Title: Backaction of a charge detector on a double quantum dot
Authors: Ouyang, Shihua
Lam, Chi-Hang
You, J. Q.
Subjects: Eigenvalues and eigenfunctions
Master equation
Quantum dots
Quantum point contacts
Issue Date: 15-Feb-2010
Publisher: American Physical Society
Citation: Physical review B, condensed matter and materials physics, 15 Feb. 2010, v. 81, no. 7, 075301, p. 1-6.
Abstract: We develop a master equation approach to study the backaction of quantum-point contact (QPC) on a double quantum dot (DQD) at zero bias voltage. We reveal why electrons can pass through the zero-bias DQD only when the bias voltage across the QPC exceeds a threshold value determined by the eigenstate energy difference in the DQD. This derived excitation condition agrees well with experiments on QPC-induced inelastic electron tunneling through a DQD [ S. Gustavsson et al. Phys. Rev. Lett. 99 206804 (2007)]. Moreover, we propose a scheme to generate a pure spin current by the QPC in the absence of a charge current.
Description: DOI: 10.1103/PhysRevB.81.075301
Rights: Physical Review B © 2010 The American Physical Society. The Journal's web site is located at http://prb.aps.org/
Type: Journal/Magazine Article
URI: http://hdl.handle.net/10397/4872
ISSN: 1098-0121 (print)
1550-235X (online)
Appears in Collections:AP Journal/Magazine Articles

Files in This Item:

File Description SizeFormat
Ouyang_Backaction_Double_Quantum.pdf677.51 kBAdobe PDFView/Open



Facebook Facebook del.icio.us del.icio.us LinkedIn LinkedIn


All items in the PolyU Institutional Repository are protected by copyright, with all rights reserved, unless otherwise indicated.
No item in the PolyU IR may be reproduced for commercial or resale purposes.

 

© Pao Yue-kong Library, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong
Powered by DSpace (Version 1.5.2)  © MIT and HP
Feedback | Privacy Policy Statement | Copyright & Restrictions - Feedback