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|Title:||Microstructure study of Bi₄Ti₃O₁₂ - SrBi₄Ti₄O[sub 15] and Bi[sub 3.25]La[sub 0.75]Ti₃O₁₂ - SrBi₄Ti₄O[sub 15] ceramics|
Zhu, J. S.
Chan, Helen L. W.
Ferroelectric thin films
|Source:||ISAF 2002 : proceedings of the 13th IEEE International Symposium on Applications of Ferroelectrics : Nara, Japan, May 28-June 1, 2002, p. 71-74.|
|Abstract:||TEM study is preformed on mixed-layer type Bismuth compounds: Bi₄Ti₃O₁₂ - SrBi₄Ti₄O[sub 15] (BT-SBTi) and Bi[sub 3.25]La[sub 0.75]Ti₃O₁₂ - SrBi₄Ti₄O[sub 15] (BLT-SBTi) ceramics. Meeting the prediction of space group theory, APBs and 90° domain wall are observed by bright- and dark-field imaging in both materials. Besides, other planer defects are found and confirmed to be stacking faults.|
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|Appears in Collections:||AP Conference Papers & Presentations|
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