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|Title: ||Microstructure study of Bi₄Ti₃O₁₂ - SrBi₄Ti₄O[sub 15] and Bi[sub 3.25]La[sub 0.75]Ti₃O₁₂ - SrBi₄Ti₄O[sub 15] ceramics|
|Authors: ||Su, D.|
Zhu, J. S.
Chan, Helen L. W.
|Subjects: ||Bismuth compounds|
Ferroelectric thin films
|Issue Date: ||2002 |
|Citation: ||ISAF 2002 : proceedings of the 13th IEEE International Symposium on Applications of Ferroelectrics : Nara, Japan, May 28-June 1, 2002, p. 71-74.|
|Abstract: ||TEM study is preformed on mixed-layer type Bismuth compounds: Bi₄Ti₃O₁₂ - SrBi₄Ti₄O[sub 15] (BT-SBTi) and Bi[sub 3.25]La[sub 0.75]Ti₃O₁₂ - SrBi₄Ti₄O[sub 15] (BLT-SBTi) ceramics. Meeting the prediction of space group theory, APBs and 90° domain wall are observed by bright- and dark-field imaging in both materials. Besides, other planer defects are found and confirmed to be stacking faults.|
|Rights: ||© 2002 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.|
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|Type: ||Conference Paper|
|Appears in Collections:||AP Conference Papers & Presentations|
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