Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/487
Title: Microstructure study of Bi₄Ti₃O₁₂ - SrBi₄Ti₄O[sub 15] and Bi[sub 3.25]La[sub 0.75]Ti₃O₁₂ - SrBi₄Ti₄O[sub 15] ceramics
Authors: Su, D.
Zhu, J. S.
Wang, Danyang
Chan, Helen L. W.
Choy, Chung-loong
Wang, Yening
Subjects: Bismuth compounds
Ferroelectricity
Ferroelectric thin films
Issue Date: 2002
Publisher: IEEE
Source: ISAF 2002 : proceedings of the 13th IEEE International Symposium on Applications of Ferroelectrics : Nara, Japan, May 28-June 1, 2002, p. 71-74.
Abstract: TEM study is preformed on mixed-layer type Bismuth compounds: Bi₄Ti₃O₁₂ - SrBi₄Ti₄O[sub 15] (BT-SBTi) and Bi[sub 3.25]La[sub 0.75]Ti₃O₁₂ - SrBi₄Ti₄O[sub 15] (BLT-SBTi) ceramics. Meeting the prediction of space group theory, APBs and 90° domain wall are observed by bright- and dark-field imaging in both materials. Besides, other planer defects are found and confirmed to be stacking faults.
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Type: Conference Paper
URI: http://hdl.handle.net/10397/487
ISBN: 0-7803-7414-2
ISSN: 1099-4734
Appears in Collections:AP Conference Papers & Presentations

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