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|Title: ||Phenomenological model for the dielectric enhancement in compositionally graded ferroelectric films|
|Authors: ||Wong, C. K.|
Shin, Franklin G.
|Subjects: ||Ferroelectric thin films|
|Issue Date: ||13-Feb-2006 |
|Publisher: ||American Institute of Physics|
|Citation: ||Applied physics letters, 13 Feb. 2006, v. 88, no. 7, 072901, p. 1-3|
|Abstract: ||The dielectric enhancement observed in compositionally graded ferroelectric films is explained by use of a multilayer model. The finite size effect of the ferroelectric layers has been taken into account. This is tackled by the employment of Landau–Ginzburg thermodynamic theory for each layer. The calculated dielectric susceptibility of the graded film reveals significant enhancement for temperatures below the phase transition point, and is greater in a continuously graded film than in one with a step gradient in composition.|
|Description: ||DOI: 10.1063/1.2175496|
|Rights: ||© 2006 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in C. K. Wong and F. G. Shin, Appl. Phys. Lett. 88, 072901 (2006) and may be found at http://link.aip.org/link/?apl/88/072901|
|Type: ||Journal/Magazine Article|
|ISSN: ||0003-6951 (print)|
|Appears in Collections:||AP Journal/Magazine Articles|
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