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Please use this identifier to cite or link to this item:
http://hdl.handle.net/10397/4625
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| Title: | Simulation of interface dislocations effect on polarization distribution of ferroelectric thin films |
| Authors: | Zheng, Yue
Wang, Biao
Woo, Chung-ho |
| Subjects: | Ferroelectric thin films
Dielectric polarisation
Dislocations
Finite difference methods
Ginzburg-Landau theory
Dielectric relaxation |
| Issue Date: | 27-Feb-2006 |
| Publisher: | American Institute of Physics |
| Citation: | Applied physics letters, 27 Feb. 2006, v. 88, no. 9, 092903, p. 1-3. |
| Abstract: | Effects of interfacial dislocations on the properties of ferroelectric thin films are investigated, using the dynamic Ginzburg–Landau equation. Our results confirm the existence of a dead layer near the film/substrate interface. Due to the combined effects of the dislocations and the near-surface eigenstrain relaxation, the ferroelectric properties of about one-third of the film volume suffers. |
| Description: | DOI: 10.1063/1.2177365 |
| Rights: | © 2006 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Y. Zheng, B. Wang & C. H. Woo, Appl. Phys. Lett. 88, 092903 (2006) and may be found at http://link.aip.org/link/?apl/88/092903 |
| Type: | Journal/Magazine Article |
| URI: | http://hdl.handle.net/10397/4625 |
| ISSN: | 0003-6951 (print)
1077-3118 (online) |
| Appears in Collections: | EIE Journal/Magazine Articles
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