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Title: Strain distribution in epitaxial SrTiO₃thin films
Authors: Zhai, Z. Y.
Wu, X. S.
Jiang, Z. S.
Hao, J. H.
Gao, J.
Cai, Y. F.
Pan, Y. G.
Subjects: Strontium compounds
Epitaxial layers
Internal stresses
X-ray diffraction
Lattice constants
Issue Date: 25-Dec-2006
Publisher: American Institute of Physics
Source: Applied physics letters, 25 Dec. 2006, v. 89, no. 26, 262902, p. 1-3.
Abstract: The lattice strain distributions of epitaxial SrTiO₃films deposited on LaAlO₃ were investigated by in situ x-ray diffraction at the temperature range of 25–300 K, grazing incident x-ray diffraction, and high resolution x-ray diffraction. The nearly linear temperature dependence of the out-of-plane lattice constant of SrTiO₃was observed in the measured temperature range. The depth distribution of the lattice strain at room temperature for SrTiO₃films includes the surface layer, strained layer, and interface layer.
Rights: © 2006 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Z. Y. Zhai et al., Appl. Phys. Lett. 89, 262902 (2006) and may be found at
Type: Journal/Magazine Article
DOI: 10.1063/1.2424282
ISSN: 0003-6951 (print)
1077-3118 (online)
Appears in Collections:AP Journal/Magazine Articles

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