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|Title: ||Strain distribution in epitaxial SrTiO₃thin films|
|Authors: ||Zhai, Z. Y.|
Wu, X. S.
Jiang, Z. S.
Hao, J. H.
Cai, Y. F.
Pan, Y. G.
|Subjects: ||Strontium compounds|
|Issue Date: ||25-Dec-2006 |
|Publisher: ||American Institute of Physics|
|Citation: ||Applied physics letters, 25 Dec. 2006, v. 89, no. 26, 262902, p. 1-3.|
|Abstract: ||The lattice strain distributions of epitaxial SrTiO₃films deposited on LaAlO₃ were investigated by in situ x-ray diffraction at the temperature range of 25–300 K, grazing incident x-ray diffraction, and high resolution x-ray diffraction. The nearly linear temperature dependence of the out-of-plane lattice constant of SrTiO₃was observed in the measured temperature range. The depth distribution of the lattice strain at room temperature for SrTiO₃films includes the surface layer, strained layer, and interface layer.|
|Description: ||DOI: 10.1063/1.2424282|
|Rights: ||© 2006 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Z. Y. Zhai et al., Appl. Phys. Lett. 89, 262902 (2006) and may be found at http://link.aip.org/link/?apl/89/262902|
|Type: ||Journal/Magazine Article|
|ISSN: ||0003-6951 (print)|
|Appears in Collections:||AP Journal/Magazine Articles|
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