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|Title: ||Ferroelectric and dielectric properties of Bi₃.₁₅Nd₀.₈₅Ti₃O₁₂ nanotubes|
|Authors: ||Cai, Wei|
Eng, Lukas M.
|Subjects: ||Bismuth compounds|
Ferroelectric thin films
Transmission electron microscopy
|Issue Date: ||1-Sep-2011 |
|Publisher: ||American Institute of Physics|
|Citation: ||Journal of applied physics, 1 Sept. 2011, v. 110, no. 5, 052004, p. 1-5.|
|Abstract: ||In order to match the high-density requirement of ferroelectric memories, ferroelectric Bi₃.₁₅Nd₀.₈₅Ti₃O₁₂ nanotubes with outer diameter of about 100 nm and wall thickness of about 30 nm were synthesized using a sol-gel method. Transmission electron microscope images and Raman spectra revealed the Bi-layered perovskite structure of these nanotubes. Their dielectric constant and remnant polarization were comparable with those of thin film form. Piezoelectric hysteresis loops of individual nanotube measured by piezoresponse force microscope indicate their asymmetry, and the switched nanotubes show long term retention.|
|Description: ||DOI: 10.1063/1.3624801|
|Rights: ||© 2011 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in W. Cai et al., J. Appl. Phys. 110, 052004 (2011) and may be found at http://link.aip.org/link/?jap/110/052004.|
|Type: ||Journal/Magazine Article|
|Appears in Collections:||AP Journal/Magazine Articles|
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