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|Title: ||Piezoresponse and ferroelectric properties of lead-free [Bi[sub 0.5](Na[sub 0.7]K[sub 0.2]Li[sub 0.1])[sub 0.5]]TiO₃ thin films by pulsed laser deposition|
|Authors: ||Wang, Danyang|
Wong, K. S.
Chan, Helen L. W.
|Subjects: ||Bismuth compounds|
Ferroelectric thin films
Piezoelectric thin films
Pulsed laser deposition
|Issue Date: ||6-Jun-2008 |
|Publisher: ||American Institute of Physics|
|Citation: ||Applied physics letters, 6 June 2008, v. 92, 222909, p. 1-3|
|Abstract: ||Polycrystalline lead-free piezoelectric [Bi[sub 0.5](Na[sub 0.7]K[sub 0.2]Li[sub 0.1])[sub 0.5]]TiO₃ (BNKLT) thin films were grown
on Pt/Ti/SiO₂/Si substrates using pulsed laser deposition (PLD). In this letter, we report the ferroelectric properties and piezoresponse of the PLD-produced BNKLT thin films. X-ray diffraction characterization revealed a good crystallinity and a pure perovskite structure in the films. The films exhibited a well-defined polarization hysteresis loop with a remnant polarization P[sub r] of 13.9 µC/cm² and a coercive field E[sub c] of 10.2 MV/m. The domain structure and its thermal-driven evolution from the ferroelectric to nonferroelectric phase were observed by piezoresponse force microscopy. The results were consistent with the phase transition profile of BNKLT bulk ceramics. Typical butterfly-shaped piezoresponse loop was obtained and the effective piezoelectric coefficient d[sub 33,f] of the BNKLT thin films was about 64 pm/V.|
|Rights: ||© 2008 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in D.Y. Wang et al. Appl. Phys. Lett. 92, 222909 (2008) and may be found at http://link.aip.org/link/?apl/92/222909|
|Type: ||Journal/Magazine Article|
|Appears in Collections:||MRC Journal/Magazine Articles|
AP Journal/Magazine Articles
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