PolyU IR

PolyU Institutional Repository >
Applied Physics >
AP Journal/Magazine Articles >

Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/4229

Title: Spectroscopic ellipsometry study of epitaxially grown Pb(Mg₁/₃Nb₂/₃)O₃–PbTiO₃/MgO/TiN/Si heterostructures
Authors: Tsang, W. S.
Chan, K. Y.
Mak, Chee-leung
Wong, Kin-hung
Subjects: Lead compounds
Magnesium compounds
Titanium compounds
Ferroelectric thin films
Epitaxial layers
Pulsed laser deposition
Vapour phase epitaxial growth
Surface morphology
Interface structure
X-ray diffraction
Scanning electron microscopy
Refractive index
Issue Date: 25-Aug-2003
Publisher: American Institute of Physics
Citation: Applied physics letters, 25 Aug. 2003, v. 83, no. 8, p. 1599-1601.
Abstract: 0.65Pb(Mg₁/₃Nb₂/₃)O₃–0.35PbTiO₃(PMN–PT) thin films have been grown on MgO/TiN-buffered Si(001) substrates using pulsed laser deposition. Their structural properties and surface morphology were examined by x-ray diffraction and scanning electron microscopy, respectively. All PMN–PT films grown at 670 °C show a cube-on-cube epitaxial relationship of PMN–PT(100)∥MgO(100)∥TiN(100)∥Si(100). Discernable interfaces between layers in the heterostructures and crack-free surfaces are evident. A spectroscopic ellipsometer was used to study the optical characteristics of the films. It was revealed that the refractive index of the PMN–PT is ∼2.50 as measured at 635 nm. This value is only slightly less than that of the PMN–PT single crystal of 2.60. Our results suggest that the PMN–PT/MgO/TiN/Si heterostructure has an excellent potential for use in integrated optical waveguide devices.
Description: DOI: 10.1063/1.1603339
Rights: © 2003 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in W. S. Tsang, K. Y. Chan & C. L. Mak, Appl. Phys. Lett. 83, 1599 (2003) and may be found at http://apl.aip.org/resource/1/applab/v83/i8/p1599_s1
Type: Journal/Magazine Article
URI: http://hdl.handle.net/10397/4229
ISSN: 0003-6951 (print)
1077-3118 (online)
Appears in Collections:AP Journal/Magazine Articles

Files in This Item:

File Description SizeFormat
Tsang_Epitaxially_Grown_Heterostructures.pdf59.62 kBAdobe PDFView/Open

Facebook Facebook del.icio.us del.icio.us LinkedIn LinkedIn

All items in the PolyU Institutional Repository are protected by copyright, with all rights reserved, unless otherwise indicated.
No item in the PolyU IR may be reproduced for commercial or resale purposes.


© Pao Yue-kong Library, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong
Powered by DSpace (Version 1.5.2)  © MIT and HP
Feedback | Privacy Policy Statement | Copyright & Restrictions - Feedback