Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/420
Title: Dielectric properties and abnormal C-V characteristics of Ba[sub 0.5]Sr[sub 0.5]TiO₃-Bi[sub 1.5]ZnNb[sub 1.5]O[sub 7] composite thin films grown on MgO (001) substrates by pulsed laser deposition
Authors: Tian, Huyong
Wang, Yu
Wang, Danyang
Miao, Jun
Qi, Jianquan
Chan, Helen L. W.
Choy, Chung-loong
Subjects: Barium compounds
Strontium compounds
Bismuth compounds
Zinc compounds
Composite materials
Ferroelectric thin films
Pulsed laser deposition
X-ray diffraction
Permittivity
Dielectric losses
Issue Date: 3-Oct-2006
Publisher: American Institute of Physics
Source: Applied physics letters, 3 Oct. 2006, v. 89, 142905, p. 1-3
Abstract: Highly c-axis oriented Ba[sub 0.5]Sr[sub 0.5]TiO₃-based composite thin films were grown on MgO (001) single-crystal substrates by pulsed laser deposition and the in-plane dielectric properties of the films evaluated. X-ray diffraction characterization revealed a good crystallinity. The dielectric constant and loss were found to be 200 and 0.001-0.007 at room temperature, respectively. The butterfly-shaped C-V characteristic curve evidenced an enhanced in-plane dielectric tunability of >90% in the films at 1 MHz under a dc bias field of 0.8 MV/cm. A brief discussion is given on the abnormal C-V curves. Various tunable microwave applications of Ba[sub 0.5]Sr[sub 0.5]TiO₃-Bi[sub 1.5]ZnNb[sub 1.5]O[sub 7] composite thin films are expected.
Rights: © 2006 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in H. Tian et al. Appl. Phys. Lett. 89, 142905 (2006) and may be found at http://link.aip.org/link/?apl/89/142905
Type: Journal/Magazine Article
URI: http://hdl.handle.net/10397/420
ISSN: 0003-6951
Appears in Collections:MRC Journal/Magazine Articles
AP Journal/Magazine Articles

Files in This Item:
File Description SizeFormat 
c-v_characteristics_06.pdf96.14 kBAdobe PDFView/Open


All items in the PolyU Institutional Repository are protected by copyright, with all rights reserved, unless otherwise indicated. No item in the PolyU IR may be reproduced for commercial or resale purposes.