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|Title:||Fabrication and characterization of Ni/P(VDF-TrFE) nanoscaled coaxial cables|
Lau, Sien Ting
Chan, Helen L. W.
Scanning electron microscopy
|Publisher:||American Institute of Physics|
|Source:||Applied physics letters, 19 June 2007, v. 90, 253107, p. 1-3|
|Abstract:||The authors have prepared poly(vinylidenefluoride-trifluoroethylene) Ni/P(VDF-TrFE) nanoscaled coaxial cables with Ni nanowires as the cores and P(VDF-TrFE) nanotubes as the shells by a two-step process. Scanning electron microscope and x-ray diffraction measurements revealed the microstructure and crystallinity of the nanocables. Electrical measurements indicated that the nanocables possessed a large specific capacitance (~10.84 pC/mm²) and ferroelectric remnant polarization (~10 µC/cm²) due to the composite structure. The distribution of electrical field in the nanostructure was also analyzed.|
|Rights:||© 2007 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in C.-L. Sun et al., Appl. Phys. Lett. 90, 253107 (2007) and may be found at http://link.aip.org/link/?apl/90/253107.|
|Appears in Collections:||MRC Journal/Magazine Articles|
AP Journal/Magazine Articles
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