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Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/412

Title: Fabrication and characterization of Ni/P(VDF-TrFE) nanoscaled coaxial cables
Authors: Sun, Chengliang
Lam, Kwok-ho
Chao, Chen
Lau, Sien Ting
Chan, Helen L. W.
Guo, Shishang
Zhao, Xingzhong
Subjects: Nickel
Ferroelectric materials
Composite materials
Coaxial cables
Dielectric polarisation
Scanning electron microscopy
X-ray diffraction
Issue Date: 19-Jun-2007
Publisher: American Institute of Physics
Citation: Applied physics letters, 19 June 2007, v. 90, 253107, p. 1-3
Abstract: The authors have prepared poly(vinylidenefluoride-trifluoroethylene) Ni/P(VDF-TrFE) nanoscaled coaxial cables with Ni nanowires as the cores and P(VDF-TrFE) nanotubes as the shells by a two-step process. Scanning electron microscope and x-ray diffraction measurements revealed the microstructure and crystallinity of the nanocables. Electrical measurements indicated that the nanocables possessed a large specific capacitance (~10.84 pC/mm²) and ferroelectric remnant polarization (~10 µC/cm²) due to the composite structure. The distribution of electrical field in the nanostructure was also analyzed.
Rights: © 2007 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in C.-L. Sun et al., Appl. Phys. Lett. 90, 253107 (2007) and may be found at http://link.aip.org/link/?apl/90/253107.
Type: Journal/Magazine Article
URI: http://hdl.handle.net/10397/412
ISSN: 00036951
Appears in Collections:MRC Journal/Magazine Articles
AP Journal/Magazine Articles

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