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Title: All-optical bit-error monitoring system using cascaded inverted wavelength converter and optical NOR gate
Authors: Chan, L. Y.
Qureshi, Khurram Karim
Wai, Ping-kong Alexander
Moses, B.
Lui, Luen-fu Kevin
Tam, Hwa-yaw
Demokan, Suleyman
Subjects: Bit-error monitoring
Injection locking
Optical data processing
Optical logic gate
Issue Date: Apr-2003
Publisher: IEEE
Source: IEEE photonics technology letters, Apr. 2003, v. 15, no. 4, p. 593-595
Abstract: A novel all-optical bit-error monitoring system is demonstrated by cascading two all-optical logic gates: an inverted wavelength converter and an optical NOR gate which are realized using injection-locked laser diodes operating at different thresholds. Real-time optical monitoring signal is generated which indicates the positions and duration of both bit and burst errors in 10-Gb/s nonreturn-to-zero signals.
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Type: Journal/Magazine Article
DOI: 10.1109/LPT.2003.809298
ISSN: 1041-1135
Appears in Collections:EE Journal/Magazine Articles
EIE Journal/Magazine Articles

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