Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/3378
Title: Fabrication and characterization of oxide-ion conducting thin films
Authors: Sze, Mo-kun Boscope
Subjects: Hong Kong Polytechnic University -- Dissertations
Oxide superconductors
Organic thin films
Electrodes, Oxide
Pulsed laser deposition
Issue Date: 2005
Publisher: The Hong Kong Polytechnic University
Abstract: Metal-doped lanthanum molybdenum oxide and metal-doped ceria have been shown to conduct oxide ions efficiently. They are being considered as very promising solid electrolytes for solid oxide fuel cells (SOFC). In particular, their ability to provide reasonably high ionic conductivity at relatively low temperatures (500-600 ℃) is an attractive feature making them useful in future low-temperature SOFCs targeted to operate at 500 ℃ or below. Thus utilizing these materials and employing the modern oxide thin film fabrication technology it is visualized that a miniaturized and low-temperature operating SOFC can be achieved. Consequently a new breed of efficient and much sought-after transferable power source for portable electronic devices and small scale electrical appliances is possible. In this project pulsed laser deposition was used to prepare some of these oxide electrolyte thin films. Structural and electrical characterizations of these films were carried out to evaluate their suitability for use in thin film SOFC. The laser ablation targets of Ce₀.₈Gd₀.₂O₂, Ce₀.₈Sm₀.₂, Zr₀.₉₂Y₀.₀₈O₂, La₂Mo₂O₉, La₁.₉Ba₀.₁Mo₂O₉, La₁.₉Ca₀.₁ Mo₂O₉, La₀.₈₅Sr₀.₁₅MnO₃, La₀.₇Sr₀.₃MnO₃, La₀.₈₅Sr₀.₁₅MnO₃, La₁-xSrxC0O₃ (0.2≤x ≤ 0.5) and SrVO₃ were fabricated by the standard solid state reaction method. The SOFC oxide electrolyte and electrode thin films were fabricated by pulsed laser deposition on (100) LaAlO3, (100) Si, (100) MgO and A1₂O₃ at various substrate temperatures spanning from 300 ℃ to 750 ℃. The ambient oxygen pressure during film growth ranged from 100 mTorr to 300 mTorr. The crystal structure, crystallinity, thickness and lattice parameters of these as-deposited films were investigated by x-ray diffraction and transmission electron microscope. It has been shown that high quality epitaxial and polycrystalline films can be obtained at different growth conditions. A radiation heating tube furnace for electrical characterization were designed and made. It was primarily used for temperature dependant impedance measurements on films over the temperature range of 200 ℃ to 800 ℃. Our results reveal good ionic conductivity in these films. In addition the observed ionic conductivities are closely related to the crystalline quality of the films. We have yielded strong experimental evidence that in utilizing these oxide electrolyte thin films, miniaturized SOFCs operating at below 550 ℃ are possible.
Description: xviii, 149 leaves : ill. ; 30 cm.
PolyU Library Call No.: [THS] LG51 .H577M AP 2005 Sze
Rights: All rights reserved.
Type: Thesis
URI: http://hdl.handle.net/10397/3378
Appears in Collections:AP Theses
PolyU Electronic Theses

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