PolyU IR
 

PolyU Institutional Repository >
Applied Physics >
AP Journal/Magazine Articles >

Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/2475

Title: Stress and its effect on optical properties of AlN nanorods
Authors: Ji, X. H.
Zhang, Q. Y.
Ling, Z. Y.
Lau, S. P.
Subjects: Aluminium compounds
Nanostructured materials
Phonons
Photoluminescence
Raman spectra
Thermal expansion
Issue Date: 7-Dec-2009
Publisher: American Institute of Physics
Citation: Applied physics letters, 7 Dec. 2009, v. 95, no. 23, 233105, p.1-3.
Abstract: The stress states in AlN nanorods deposited on Si and its effect on optical properties have been investigated by means of Raman scattering and photoluminescence methods. The observed frequency downshift and linewidth broadening from temperature-dependent Raman scattering can be well described by an empirical relationship taking into account the contributions of the thermal expansion and decay of optical phonons. The phonon-energy difference of the E₂(high) mode between the stress-free bulk-AlN and AlN nanorods appears to increase with increasing temperature, demonstrating that differential thermal expansion between the Si-substrate and AlN nanorods is the key parameter reflecting the stress in the nanorods.
Description: DOI: 10.1063/1.3271774
Rights: © 2009 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in X.H. Ji et al., Appl. Phys. Lett. 95, 233105 (2009) and may be found at http://link.aip.org/link/?apl/95/233105
Type: Journal/Magazine Article
URI: http://hdl.handle.net/10397/2475
ISSN: 0003-6951 (print)
1077-3118 (online)
Appears in Collections:AP Journal/Magazine Articles

Files in This Item:

File Description SizeFormat
ApplPhysLett_95_233105.pdf425.43 kBAdobe PDFView/Open



Facebook Facebook del.icio.us del.icio.us LinkedIn LinkedIn


All items in the PolyU Institutional Repository are protected by copyright, with all rights reserved, unless otherwise indicated.
No item in the PolyU IR may be reproduced for commercial or resale purposes.

 

© Pao Yue-kong Library, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong
Powered by DSpace (Version 1.5.2)  © MIT and HP
Feedback | Privacy Policy Statement | Copyright & Restrictions - Feedback