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|Title: ||Fast and reliable estimation of multiple parametric images using an integrated method for dynamic SPECT|
|Authors: ||Wen, Lingfeng|
Feng, D. David
|Subjects: ||Clustering methods|
Single photon emission computed tomography (SPECT)
|Issue Date: ||Feb-2007 |
|Citation: ||IEEE transactions on medical imaging, Feb. 2007, v. 26, no. 2, p. 179-189.|
|Abstract: ||Dynamic single photon emission computed tomography (SPECT) has demonstrated the potential to quantitatively estimate physiological parameters in the brain and the heart. The generalized linear least square (GLLS) method is a well-established
method for solving linear compartment models with fast computational speed. However, the high level of noise intrinsic in the SPECT data leads to reliability and instability problems of GLLS for generating parametric images. An integrated method is proposed to restrict the noise in both the temporal and spatial domains to estimate multiple parametric images for dynamic SPECT. This method comprises three steps which are optimum image sampling schedule in the projection space, cluster analysis applied postreconstruction and parametric image generation with GLLS. The simulation and experimental studies for the neuronal
nicotine acetylcholine receptor tracer of 5-[¹ ² ³ I]-iodo-A-85380 were employed to evaluate the performance of the proposed
method. The results of influx rate of K₁ and volume of distribution of V[sub d]demonstrated that the integrated method was successful in generating low noise parametric images for high noise SPECT data without enhancing the partial volume effect. Furthermore, the integrated method is computationally efficient for potential
|Description: ||DOI: 10.1109/TMI.2006.889708|
|Rights: ||© 2007 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.|
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|Type: ||Journal/Magazine Article|
|Appears in Collections:||EIE Journal/Magazine Articles|
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