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|Title: ||Three dimensional measurement, evaluation and grading system for fabric/textile structure/garment appearance|
|Authors: ||Hu, Jinlian|
|Subjects: ||Three dimensional measurement, evaluation and grading system|
Fabric and textile structure
|Issue Date: ||11-Jan-2005 |
|Citation: ||US Patent 6,842,532 B2. Washington, DC: US Patent and Trademark Office, 2005.|
|Abstract: ||A method of three dimensional measurement, evaluation, and grading system for fabric/textile structure/garment appearance, based an values P and Q, is carried out using a fixed digital camera positioned above a piece of the fabric, shining at least two different parallel light beams from inclined directions onto the surface of the fabric and capturing different reflected images of the surface with the camera. The captured images are analysed to derive certain parameters relevant to the appearance. In particular, values of P+Q may be used in a grading evaluation, where P and Q are summations of the surface gradients for a plurality of evenly distributed points in an x direction and in a y direction of the surface, respectively.|
|Rights: ||Assignee: The Hong Kong Polytechnic University.|
|Appears in Collections:||ITC Patents|
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