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|Title: ||Textile fabric testing|
|Authors: ||Li, Yi|
Hu, Jun Yan
|Subjects: ||Textile fabric testing apparatus|
|Issue Date: ||5-Aug-2003 |
|Citation: ||US Patent 6,601,457 B2. Washington, DC: US Patent and Trademark Office, 2003.|
|Abstract: ||A single fabric testing apparatus is capable of measuring mechanical and thermal characteristics of a specimen previously carried out in separate testing apparatuses. The single apparatus is provided with a plurality of mechanical and temperature sensors and a heatable top plate. In use, a ram moves the top plate vertically downwards to press a fabric specimen against a bottom plate. The plate is surrounded by a fixed upstanding peripheral skirt against which an outer periphery of the specimen is bent to enable shearing and bending characteristics to be measured. The bottom plate is biased upwards by a spring which is compressed until the top plate is arrested by a fixed frame member. Further downward movement of the ram enables compressibility of the specimen to be determined. A rotatable section of the top plate can be turned by a stepping motor to determine the surface friction characteristics of the specimen.|
|Rights: ||Assignee: The Hong Kong Polytechnic University.|
|Appears in Collections:||ITC Patents|
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