PolyU IR
 

PolyU Institutional Repository >
Logistics and Maritime Studies >
LMS Journal/Magazine Articles >

Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/150

Title: From customer orientation to customer satisfaction: the gap between theory and practice
Authors: Yeung, Andy C. L.
Cheng, T. C. Edwin
Chan, Ling-yau
Subjects: Customer orientation
Customer satisfaction
Process improvement
Operational efficiency
Issue Date: Feb-2004
Publisher: IEEE
Citation: IEEE Transactions on engineering management, Feb. 2004, v. 51, no. 1, p. 85-97.
Abstract: The classical quality management theory suggests that different quality improvement practices have a similar positive effect on overall operational efficiency, leading to customer satisfaction. Based on a study of 225 organizations in the electronics industry in Hong Kong, we find that individual quality improvement practice has a specific effect on operational performance, rather than equally improving the overall operational efficiency. Our investigations indicate that customer orientation practices primarily affect time-based efficiency, while process improvement efforts help cost-related performance. On the other hand, emphasizing process-control systems leads to customer satisfaction directly without necessarily improving operations. While supporting the basic assertions of the classical quality management theory, these findings reveal that several problems exist in the practice of quality management in industry, and suggest that a re-direction of several quality management practices seems necessary. This research refines the understanding of quality management by explicating the specific effect of customer orientation and process management on organizational performance.
Description: DOI: 10.1109/TEM.2003.822466
Rights: © 2006 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
Type: Journal/Magazine Article
URI: http://hdl.handle.net/10397/150
ISSN: 00189391
Appears in Collections:LMS Journal/Magazine Articles

Files in This Item:

File Description SizeFormat
01266856.pdf487.75 kBAdobe PDFView/Open



Facebook Facebook del.icio.us del.icio.us LinkedIn LinkedIn


All items in the PolyU Institutional Repository are protected by copyright, with all rights reserved, unless otherwise indicated.
No item in the PolyU IR may be reproduced for commercial or resale purposes.

 

© Pao Yue-kong Library, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong
Powered by DSpace (Version 1.5.2)  © MIT and HP
Feedback | Privacy Policy Statement | Copyright & Restrictions - Feedback