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Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/129

Title: Non-contact measurement of material property
Authors: Zheng, Yong-Ping
Lu, Min-Hua
Subjects: Non-contact measurement
Material property
Issue Date: 24-Oct-2006
Citation: US Patent 7,124,636 B2. Washington, DC: US Patent and Trademark Office, 2006.
Abstract: A process for measuring a property of a sample is provided. The sample has an external surface enclosing an inner portion, and firstly, the sample is deformed by applying a predetermined non-contact pressure to deform a portion of the sample. Then a signal, which is at least suitable for transmission over the air, is directed towards the deformed portion of the sample, and further propagates through the external surface and the inner portion of the sample. Then an echoed signal generated by the inner portion of the sample in response to the propagation of the signal is detected; wherein the echoed signal incorporates information relating to a deformation of the inner portion of the sample. The property of the sample is determined from the deformation of the inner portion of the sample.
Rights: Assignee: The Hong Kong Polytechnic University.
Type: Patent
URI: http://hdl.handle.net/10397/129
Appears in Collections:HTI Patents
Patents of PolyU

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