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Browsing by Author "Ong, C. W."

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Showing results 1 to 11 of 11
Issue DateTitleAuthor(s)
15-Nov-1993 Effects of Si incorporation on the structural change of a-BₓSi₁₋ₓ alloy filmsOng, C. W.; Chik, K. P.; Wong, H. K.
Jan-2005 Manually operated scratch tester for characterization of mechanical properties of thin filmsWang, Hairong; Ong, C. W.; Tsui, Yun Cheong; Lau, W. M.
15-Nov-2000 Measurement of mechanical properties for dense and porous polymer films having a low dielectric constantXu, Yuhuan; Tsai, Yipin; Zheng, D. W.; Tu, K. N.; Ong, C. W.; Choy, Chung-loong; Zhao, Bin; Liu, Q.-Z.; Brongo, Maureen
12-Dec-2006 Method of determining elastic modulusMa, Dejun; Ong, C. W.
1-Jul-2003 Methodology for the evaluation of yield strength and hardening behavior of metallic materials by indentation with spherical tipMa, Dejun; Ong, C. W.; Lu, Jian; He, Jiawen
Jun-2005 New method for determining Young's modulus by non-ideally sharp indentationMa, Dejun; Ong, C. W.; Wong, Sing-fai; He, Jiawen
Jul-2004 New relationship between Young's modulus and nonideally sharp indentation parametersMa, Dejun; Ong, C. W.; Wong, Sing-fai
Jun-2001 Relationship between the microstructure and nanoindentation hardness of thermally evaporated and magnetron-sputtered electrochromic tungsten oxide filmsOng, C. W.; Wong, H. Y.; Pang, Geoffrey Kin-hung; Baba-Kishi, K. Z.; Choy, Chung-loong
Oct-2003 Tensile strength of zinc oxide films measured by a microbridge methodOng, C. W.; Zong, D. G.; Aravind, M.; Choy, Chung-loong; Lu, D. R.
Oct-2011 Versatile computer-controlled system for characterization of gas sensing materialsZhao, M.; Huang, J. X.; Wong, Man-hon; Tang, Y. M.; Ong, C. W.
1-Apr-2004 X-ray photoemission spectroscopy of nonmetallic materials: Electronic structures of boron and BᵪOᵧOng, C. W.; Huang, Haitao; Zheng, B.; Kwok, R. W. M.; Hui, Y. Y.; Lau, W. M.
Showing results 1 to 11 of 11

 

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